Recent developments in X-UV optics and X-UV diagnostics

Philippe Zeitoun 1 Philippe Balcou 2 Samuel Bucourt 3 Franck Delmotte 4 Guillaume Dovillaire 3 D. Douillet 2 J. Dunn 5 Gabriel Faivre 1 M. Fajardo 1 K.A. Goldberg 6 S. Hubert 1, 2 J. R. Hunter 5 Mourad Idir 1 Sylvie Jacquemot 7 S. Kazamias 2 S. Le Pape 1 Xavier Levecq 3 C.L.S. Lewis 8 R. Marmoret 7 P. Mercere 1 Anne-Sophie Morlens 1 P. P. Naulleau 6 Marie-Françoise Ravet 4 C. Remond 7 J. J. Rocca 9 R.F. Smith 5 P. Troussel 7 C. Valentin 2 L. Vanbostal 1
1 LIXAM - Laboratoire d'interaction du rayonnement X avec la matière
2 LOA - Laboratoire d'optique appliquée
3 Imagine Optic
4 Laboratoire Charles Fabry de l'Institut d'Optique / Scop
LCFIO - Laboratoire Charles Fabry de l'Institut d'Optique
5 LLNL - Lawrence Livermore National Laboratory
6 Center for X-ray Optics
7 DAM/DIF - DAM Île-de-France
8 School of Mathematics and Physics
9 NSF ERC For Extreme Ultraviolet Science and Technology and Department of Electrical and Computer Engineering
Abstract : Metrology of XUV beams (X-ray lasers, high-harmonic generation and VUV free-electron lasers) is of crucial importance for the development of applications. We have thus developed several new optical systems enabling us to measure the optical properties of XUV beams. By use of a Michelson interferometer working as a Fourier-transform spectrometer, the line shapes of different X-ray lasers have been measured with a very high accuracy (Δλ/λ~10^-6). Achievement of the first XUV wavefront sensor has enabled us to measure the beam quality of laser-pumped as well as discharge-pumped X-ray lasers. A capillary discharge X-ray laser has demonstrated a very good wavefront allowing us to achieve an intensity as high as 3×10^14 W cm^-2 by focusing with a f=5 cm mirror. The sensor accuracy has been measured using a calibrated spherical wave generated by diffraction. The accuracy has been estimated to be as good as λ/120 at 13 nm. Commercial developments are underway. At Laboratoire drsquoOptique Appliquée, we are setting up a new beamline based on high-harmonic generation in order to start the femtosecond, coherent XUV optic .
Document type :
Journal articles
Complete list of metadatas
https://hal-polytechnique.archives-ouvertes.fr/hal-00522659
Contributor : Thuy Le <>
Submitted on : Friday, October 1, 2010 - 12:45:43 PM
Last modification on : Wednesday, July 3, 2019 - 10:48:02 AM

Links full text

openaccess

Identifiers

Collections

X-LOA | X | IOGS | LCF_SCOP | LCFIO | PARISTECH | ENSTA | ENSTA_LOA | CEA | X-DEP-PHYS | DAM

Citation

Philippe Zeitoun, Philippe Balcou, Samuel Bucourt, Franck Delmotte, Guillaume Dovillaire, et al.. Recent developments in X-UV optics and X-UV diagnostics. Applied Physics B - Laser and Optics, Springer Verlag, 2004, 78 (7-8), pp.983-988. ⟨10.1007/s00340-004-1430-9⟩. ⟨hal-00522659⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

499

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD