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Characterization of collisionally pumped optical-field-ionization soft X-ray lasers

Tomas Mocek 1 Stéphane Sebban 1 Islam Bettaibi 1 L. M. Upcraft 1 Philippe Balcou 1 P. Breger 2 Philippe Zeitoun 3 S. Le Pape 3 David Ros 3 Annie Klisnick 3 A. Carillon 3 G. Jamelot 3 B. Rus 4 J.-F. Wyart 5
1 LOA - Laboratoire d'optique appliquée
2 SPAM - Service des Photons, Atomes et Molécules
3 LIXAM - Laboratoire d'interaction du rayonnement X avec la matière
4 Department of X Ray Lasers
5 LAC - Laboratoire Aimé Cotton
Abstract : We give an overview of recent experimental results on optical-field-ionization collisional soft X-ray lasers developed at LOA. By focusing a 30-fs, circularly polarized Ti-sapphire laser pulse at an intensity of up to 8×10^17 Wcm^-2 into a low-density gas cell containing Xe or Kr, we produced a few mm long plasma column for soft X-ray amplifier. Saturated amplification has been achieved on the 4d^95d(1S0)–4^95p(1P1) transition at 41.8 nm in Xe8+, and on the 3d^94d(1S0)–3d^94p(1P1) transition in Kr8+ at 32.8 nm. Under optimum pumping conditions the Xe8+ laser provides about (5±2)×10^9 photons per pulse whilst the Kr8+ laser delivers up to (2.5±1)×10^9 photons per shot. The repetition rate of these soft X-ray lasers is 10 Hz. The beam wavefront of the Xe8+ laser has been measured by a Shack–Hartmann soft X-ray wavefront sensor, and the pulse duration by a cross-correlation technique.
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https://hal-polytechnique.archives-ouvertes.fr/hal-00522717
Contributor : Thuy Le Connect in order to contact the contributor
Submitted on : Friday, October 1, 2010 - 2:39:15 PM
Last modification on : Saturday, December 4, 2021 - 3:50:19 AM

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CNRS | X | X-LOA | CEA | PARISTECH | ENSTA_LOA | ENSTA | SPAM | ENS-CACHAN | X-DEP-PHYS | ENS-PARIS-SACLAY | IRAMIS

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Tomas Mocek, Stéphane Sebban, Islam Bettaibi, L. M. Upcraft, Philippe Balcou, et al.. Characterization of collisionally pumped optical-field-ionization soft X-ray lasers. Applied Physics B - Laser and Optics, Springer Verlag, 2004, 78 (7-8), pp.939-944. ⟨10.1007/s00340-004-1436-3⟩. ⟨hal-00522717⟩

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