Compliant interfaces: A mechanism for relaxation of dislocation pile-ups in a sheared single crystal

Kostas Danas 1 Vikram Deshpande 2 Norman Fleck 2
1 LMS - Laboratoire de mécanique des solides
2 Department of Engineering [Cambridge]
Abstract : Discrete dislocation plasticity models and strain-gradient plasticity theories are used to investigate the role of interfaces in the elastic–plastic response of a sheared single crystal. The upper and lower faces of a single crystal are bonded to rigid adherends via interfaces of finite thickness. The sandwich system is subjected to simple shear, and the effect of thickness of crystal layer and of interfaces upon the overall response are explored. When the interface has a modulus less than that of the bulk material, both the predicted plastic size effect and the Bauschinger effect are considerably reduced. This is due to the relaxation of the dislocation stress field by the relatively compliant surface layer. On the other hand, when the interface has a modulus equal to that of the bulk material a strong size effect in hardening as well as a significant reverse plasticity are observed in small specimens. These effects are attributed to the energy stored in the elastic fields of the geometrically necessary dislocations (GNDs).
Keywords : Discrete dislocations Size effects Strain-gradient plasticity Interfaces Crystal plasticity
Document type :
Journal articles
Complete list of metadatas
https://hal-polytechnique.archives-ouvertes.fr/hal-00526647
Contributor : Kostas Danas <>
Submitted on : Friday, October 15, 2010 - 12:07:44 PM
Last modification on : Wednesday, March 27, 2019 - 4:16:23 PM

Identifiers

Collections

X | X-LMS | PARISTECH | ENSMP | ENSMP_LMS | INSTITUT-TELECOM | PSL | X-DEP-MECA

Citation

Kostas Danas, Vikram Deshpande, Norman Fleck. Compliant interfaces: A mechanism for relaxation of dislocation pile-ups in a sheared single crystal. International Journal of Plasticity, Elsevier, 2010, 26, pp.1792-1805. ⟨10.1016/j.ijplas.2010.03.008⟩. ⟨hal-00526647⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

157

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD