Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites

Gilbert Boyer 1 Karsten Plamann 1
1 LOA - Laboratoire d'optique appliquée
Abstract : We present a new optical microscope in which the light transmitted by a sample-scanned transmission confocal microscope is frequency-tripled by SiOx nanocrystallites in lieu of being transmitted by a confocal pinhole. This imaging technique offers an increased contrast and a high scattered light rejection. It is demonstrated that the contrast close to the Sparrow resolution limit is enhanced and the sectioning power are increased with respect to the linear confocal detection mode. An experimental implementation is presented and compared with the conventional linear confocal mode.
Document type :
Journal articles
Complete list of metadatas
https://hal-polytechnique.archives-ouvertes.fr/hal-00527801
Contributor : Thuy Le <>
Submitted on : Wednesday, October 20, 2010 - 12:10:54 PM
Last modification on : Wednesday, July 3, 2019 - 10:48:02 AM

Identifiers

  • HAL Id : hal-00527801, version 1

Collections

X | X-LOA | PARISTECH | ENSTA | ENSTA_LOA | X-DEP-PHYS

Citation

Gilbert Boyer, Karsten Plamann. Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites. Chinese Optics Letters, Optical Society of America (imprimé) / OSA publishing (en ligne), 2007, 5 (8), pp.477-479. ⟨hal-00527801⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

105

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD