Comparative study of atomic force mode and tunneling mode tip-enhanced Raman spectroscopy

Gennaro Picardi 1, * Quang Nguyen 1 Joachim Schreiber 2 Razvigor Ossikovski 1
* Corresponding author
1 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
2 Raman Division
HORIBA France SAS [Villeneuve d'Ascq]
Abstract : In Tip-Enhanced Raman Spectroscopy (TERS) a metal (or metallized) sharp tip is used to enhance the electromagnetic field by a localized surface-plasmon excitation. Two different modes - atomic force mode (AFM) and scanning tunneling mode (STM) - together with their respective types of probe tips are used in TERS experiments. We have compared the efficiency in enhancing the Raman signal on a thin dye layer for metal-coated AFM tips as well as for electrochemically etched metal STM tips. A much higher enhancement factor and better reproducibility were found when using STM tips. The very different performance is mainly attributed to the more efficient plasmonic excitation when using bulk-metal tips and possibly to the morphological differences in the tip and apex shapes existing between the two tip types.
Keywords : Near-field scanning optical microscopes Atomic force microscopes Infrared and Raman spectra Collective excitations
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Journal articles
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https://hal-polytechnique.archives-ouvertes.fr/hal-00838071
Contributor : Gennaro Picardi <>
Submitted on : Monday, June 24, 2013 - 4:34:22 PM
Last modification on : Wednesday, March 27, 2019 - 4:20:04 PM

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Gennaro Picardi, Quang Nguyen, Joachim Schreiber, Razvigor Ossikovski. Comparative study of atomic force mode and tunneling mode tip-enhanced Raman spectroscopy. European Physical Journal: Applied Physics, EDP Sciences, 2007, 40, pp.197-201. ⟨10.1051/epjap:2007144⟩. ⟨hal-00838071⟩

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