Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy-Tip-Enhanced Raman Spectroscopy

Gennaro Picardi (1) , Quang Nguyen (1) , Razvigor Ossikovski (1) , Joachim Schreiber (2)

1 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
2 Raman Division

We used scanning tunneling microscopy-tip-enhanced Raman spectroscopy (STM-TERS) to study the polarization properties of near-field scattering on a crystalline material as well as on a dye adsorbate. The measurements on a (111)-oriented c-Si sample were found to be well described by a recently proposed model for TERS and allowed for a characterization of the polarization properties of the tips used. The tip enhancement was stronger for excitation radiation having a field component along the tip axis for both types of samples. A non-negligible enhancement was also found for the field component perpendicular to the tip axis.

Keywords: Polarization; Tip-enhanced Raman spectroscopy; TERS; Scanning tunneling microscopy; STM; Si; Brilliant cresyl blue.; Brilliant cresyl blue

Domains: Physics [physics]; Physics [physics]; Chemical Physics [physics.chem-ph]

Gennaro Picardi, Quang Nguyen, Razvigor Ossikovski, Joachim Schreiber. Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy-Tip-Enhanced Raman Spectroscopy. Applied Spectroscopy, 2007, 61 (12), pp.1301. ⟨hal-00838078⟩