Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy-Tip-Enhanced Raman Spectroscopy

Abstract : We used scanning tunneling microscopy-tip-enhanced Raman spectroscopy (STM-TERS) to study the polarization properties of near-field scattering on a crystalline material as well as on a dye adsorbate. The measurements on a (111)-oriented c-Si sample were found to be well described by a recently proposed model for TERS and allowed for a characterization of the polarization properties of the tips used. The tip enhancement was stronger for excitation radiation having a field component along the tip axis for both types of samples. A non-negligible enhancement was also found for the field component perpendicular to the tip axis.
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https://hal-polytechnique.archives-ouvertes.fr/hal-00838078
Contributor : Gennaro Picardi <>
Submitted on : Monday, June 24, 2013 - 4:39:52 PM
Last modification on : Wednesday, March 27, 2019 - 4:20:04 PM

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Gennaro Picardi, Quang Nguyen, Razvigor Ossikovski, Joachim Schreiber. Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy-Tip-Enhanced Raman Spectroscopy. Applied Spectroscopy, Society for Applied Spectroscopy, 2007, 61 (12), pp.1301. ⟨hal-00838078⟩

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