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Journal Articles Applied Spectroscopy Year : 2007

Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy-Tip-Enhanced Raman Spectroscopy

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Abstract

We used scanning tunneling microscopy-tip-enhanced Raman spectroscopy (STM-TERS) to study the polarization properties of near-field scattering on a crystalline material as well as on a dye adsorbate. The measurements on a (111)-oriented c-Si sample were found to be well described by a recently proposed model for TERS and allowed for a characterization of the polarization properties of the tips used. The tip enhancement was stronger for excitation radiation having a field component along the tip axis for both types of samples. A non-negligible enhancement was also found for the field component perpendicular to the tip axis.
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Dates and versions

hal-00838078 , version 1 (24-06-2013)

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  • HAL Id : hal-00838078 , version 1

Cite

Gennaro Picardi, Quang Nguyen, Razvigor Ossikovski, Joachim Schreiber. Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy-Tip-Enhanced Raman Spectroscopy. Applied Spectroscopy, 2007, 61 (12), pp.1301. ⟨hal-00838078⟩
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