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Journal articles
Simple model for the polarization effects in tip-enhanced Raman spectroscopy
Abstract : The paper addresses the polarization properties of tip enhanced Raman spectroscopy TERS through an experimental study on 001 - and 111 -oriented crystalline Si samples and quantitatively describes them by using a simple phenomenological model. The model, conceptually similar to that used in surface-enhanced Raman scattering SERS , is based on the introduction of a phenomenological tip-amplification tensor accounting for the interaction of the tip with the electromagnetic field. It was found to be in a good agreement not only with our experimental data but also with the measurements and numerical simulations of other groups.
https://hal-polytechnique.archives-ouvertes.fr/hal-00838082
Contributor : Gennaro Picardi Connect in order to contact the contributor
Submitted on : Monday, June 24, 2013 - 4:42:51 PM
Last modification on : Wednesday, February 17, 2021 - 3:26:05 PM
Contributor : Gennaro Picardi Connect in order to contact the contributor
Submitted on : Monday, June 24, 2013 - 4:42:51 PM
Last modification on : Wednesday, February 17, 2021 - 3:26:05 PM