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Simple model for the polarization effects in tip-enhanced Raman spectroscopy

Abstract : The paper addresses the polarization properties of tip enhanced Raman spectroscopy TERS through an experimental study on 001 - and 111 -oriented crystalline Si samples and quantitatively describes them by using a simple phenomenological model. The model, conceptually similar to that used in surface-enhanced Raman scattering SERS , is based on the introduction of a phenomenological tip-amplification tensor accounting for the interaction of the tip with the electromagnetic field. It was found to be in a good agreement not only with our experimental data but also with the measurements and numerical simulations of other groups.
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Contributor : Gennaro Picardi Connect in order to contact the contributor
Submitted on : Monday, June 24, 2013 - 4:42:51 PM
Last modification on : Wednesday, February 17, 2021 - 3:26:05 PM




Razvigor Ossikovski, Quang Nguyen, Gennaro Picardi. Simple model for the polarization effects in tip-enhanced Raman spectroscopy. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2007, 75, pp.045412. ⟨10.1103/PhysRevB.75.045412⟩. ⟨hal-00838082⟩



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