Phase Change Materials and Their Application to Nonvolatile Memories

Simone Raoux 1 W. Welnic 2 Daniele Ielmini 3
1 IBM Thomas J. Watson Research Center
2 LSI - Laboratoire des Solides Irradiés
3 POLIMI - Politecnico di Milano [Milan]
Keywords : SOLID IMMERSION LENS NEAR-FIELD STRUCTURE INTRINSIC DATA RETENTION ATOMIC-FORCE MICROSCOPY OPTICAL-DATA STORAGE AMORPHOUS TE ALLOYS THIN-FILMS CHALCOGENIDE GLASSES GE2SB2TE5 FILMS CHANGE MEDIA
Document type :
Journal articles
Complete list of metadatas
https://hal-polytechnique.archives-ouvertes.fr/hal-01081911
Contributor : Gaëlle Bruant <>
Submitted on : Wednesday, November 12, 2014 - 10:53:16 AM
Last modification on : Tuesday, August 13, 2019 - 11:10:03 AM

Identifiers

Collections

X | CEA | CNRS | X-LSI | DSM-IRAMIS | PARISTECH | CEA-DRF | X-DEP-PHYS

Citation

Simone Raoux, W. Welnic, Daniele Ielmini. Phase Change Materials and Their Application to Nonvolatile Memories. Chemical Reviews, American Chemical Society, 2010, 110 (1), pp.240-267. ⟨10.1021/cr900040x⟩. ⟨hal-01081911⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

217

Contact

Informations

CCSD