Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates

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https://hal-polytechnique.archives-ouvertes.fr/hal-01401078
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Submitted on : Tuesday, November 22, 2016 - 7:51:37 PM
Last modification on : Monday, April 1, 2019 - 5:36:08 PM

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Vladimir Neplokh, Ahmed Ali, François H. Julien, Martin Foldyna, Ivan Mukhin, et al.. Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates. Materials Science in Semiconductor Processing, Elsevier, 2016, 55, pp.72 - 78. ⟨10.1016/j.mssp.2016.03.002⟩. ⟨hal-01401078⟩

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