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Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates

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https://hal-polytechnique.archives-ouvertes.fr/hal-01401078
Contributor : Martin Foldyna Connect in order to contact the contributor
Submitted on : Tuesday, November 22, 2016 - 7:51:37 PM
Last modification on : Wednesday, March 23, 2022 - 12:08:19 PM

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Vladimir Neplokh, Ahmed Ali, François H. Julien, Martin Foldyna, Ivan Mukhin, et al.. Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates. Materials Science in Semiconductor Processing, Elsevier, 2016, 55, pp.72 - 78. ⟨10.1016/j.mssp.2016.03.002⟩. ⟨hal-01401078⟩

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