Service interruption on Monday 11 July from 12:30 to 13:00: all the sites of the CCSD (HAL, Epiciences, SciencesConf, AureHAL) will be inaccessible (network hardware connection).
Skip to Main content Skip to Navigation
Journal articles

Two-scale homogenization to determine effective parameters of thin metallic-structured films

Abstract : We present a homogenization method based on matched asymptotic expansion technique to derive effective transmission conditions of thin structured films. The method leads unambiguously to effective parameters of the interface which define jump conditions or boundary conditions at an equivalent zero thickness interface. The homogenized interface model is presented in the context of electromagnetic waves for metallic inclusions associated with Neumann or Dirichlet boundary conditions for transverse electric or transverse magnetic wave polarization. By comparison with full-wave simulations, the model is shown to be valid for thin interfaces up to thicknesses close to the wavelength. We also compare our effective conditions with the two-sided impedance conditions obtained in transmission line theory and to the so-called generalized sheet transition conditions
Document type :
Journal articles
Complete list of metadata
Contributor : Jean-Jacques Marigo Connect in order to contact the contributor
Submitted on : Wednesday, December 6, 2017 - 12:54:20 PM
Last modification on : Sunday, June 26, 2022 - 2:19:02 AM


Files produced by the author(s)



Jean-Jacques Marigo, Agnès Maurel. Two-scale homogenization to determine effective parameters of thin metallic-structured films. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, Royal Society, The, 2016, 472 (2192), ⟨10.1098/rspa.2016.0068⟩. ⟨hal-01657096⟩



Record views


Files downloads