, Ellipsometry and Polarized Light, 1987.
Polarimetry, Handbook of Opics II, 1995. ,
, Spectroscopic Ellipsometry: Principles and Applications, 2007.
Practical Application to Thin Film Characterization (Momentum, 2016. ,
Recent developments in instrumentation in ellipsometry, Surf. Sci, vol.96, pp.108-140, 1980. ,
Obtainment of the polarizing and retardation parameters of a non-depolarizing optical system from the polar decomposition of its Mueller matrix, Optik, vol.76, pp.67-71, 1987. ,
Interpretation of nondepolarizing Mueller matrices based on singular value decomposition, J. Opt. Soc. Am. A, vol.25, pp.473-482, 2008. ,
Interpretation of Mueller matrices based on polar decomposition, J. Opt. Soc. Am. A, vol.13, pp.1106-1113, 1996. ,
Analysis of depolarizing Mueller matrices through a symmetric decomposition, J. Opt. Soc. Am. A, vol.26, pp.1109-1118, 2009. ,
URL : https://hal.archives-ouvertes.fr/hal-00527395
Polarimetric subtraction of Mueller matrices, J. Opt. Soc. Am. A, vol.30, pp.1078-1088, 2013. ,
Serial-parallel decompositions of Mueller matrices, J. Opt. Soc. Am. A, vol.30, pp.32-50, 2013. ,
Differential matrix formalism for depolarizing anisotropic media, Opt. Lett, vol.36, pp.2330-2332, 2011. ,
Polarized Light (Marcel Dekker, 2003. ,
Generalized ellipsometry and complex optical systems, pp.323-332, 1998. ,
Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements, Appl. Opt, vol.46, pp.4963-4967, 2007. ,
Polarization modulation ellipsometry" in Handbook of Ellipsometry, 2005. ,
Complete Mueller matrix from a partial polarimetry experiment: the nineelement case, J. Opt. Soc. Am. A ,
URL : https://hal.archives-ouvertes.fr/hal-02436960
Optimization and structuring of the instrument matrix for polarimetric measurements, Opt. Eng, vol.41, pp.965-972, 2002. ,
Determination of the polarization characteristics of objects by the method of three probing polarizations, J. Appl. Spectrosc, vol.69, pp.72-77, 2002. ,
Structure of deterministic Mueller matrices and their reconstruction in the method of three input polarizations, J. Appl. Spectrosc, vol.70, pp.224-229, 2003. ,
Recovery of the complete Mueller matrix of an arbitrary object in the method of three input polarizations, J. Appl. Spectrosc, vol.71, pp.128-132, 2004. ,
Incomplete Mueller polarimetry: Measurement of the block-diagonal scattering matrix, J. Quant. Spectrosc. Radiat. Transfer, vol.112, pp.1796-1802, 2011. ,
Conditions for the physical realizability of matrix operators in polarimetry, SPIE Proc. Polarization Considerations for Optical Systems II, vol.1166, pp.177-185, 1989. ,
, The Mueller Matrix Approach, 2016.
Basic properties and classification of Mueller matrices derived from their statistical definition, J. Opt. Soc. Am. A, vol.34, pp.1727-1737, 2017. ,
Analytic inversion of the Mueller-Jones polarization matrices for homogeneous media, Opt. Lett, vol.35, pp.3525-3525, 2010. ,
Characterization of grating structures by Mueller polarimetry in presence of strong depolarization due to finite spot size, Opt. Commun, vol.282, pp.735-741, 2009. ,
URL : https://hal.archives-ouvertes.fr/hal-00453274
Retrieval of a non-depolarizing component of experimentally determined depolarizing Mueller matrices, Opt. Express, vol.17, pp.12794-12806, 2009. ,
Application of the arbitrary decomposition to finite spot size Mueller matrix measurements, Appl. Opt, vol.53, pp.6030-6036, 2014. ,
URL : https://hal.archives-ouvertes.fr/hal-01065059
Decomposition of a depolarizing Mueller matrix into its nondepolarizing components by using symmetry conditions, Appl. Opt, vol.55, pp.2543-2550, 2016. ,
Retrieval of nondepolarizing components of depolarizing Mueller matrices by using symmetry conditions and least squares minimization, Appl. Surf. Sci, vol.421, pp.697-701, 2017. ,
Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV-visible-near-IR ellipsometry, Thin Solid Films, pp.108-113, 1998. ,
Incoherent reflection model for spectroscopic ellipsometry of a thick semi-transparent anisotropic substrate, Appl. Opt, vol.39, pp.2071-2077, 2000. ,
Measurement of transmission and reflection from a thick anisotropic crystal modeled by a sum of incoherent partial waves, J. Opt. Soc. Am. A, vol.32, pp.2049-2057, 2015. ,
Transmission ellipsometry of anisotropic substrates and thin films at oblique incidence. Handling multiple reflections, Thin Solid Films, vol.571, pp.701-705, 2014. ,
, Light Scattering by Small Particles, 1981.
Mueller matrix polarimetry with four photoelastic modulators: theory and calibration, Appl. Opt, vol.51, pp.6805-6817, 2012. ,