C. Brosseau, Fundamentals of Polarized Light. A Statistical Optics Approach, 1998.

R. A. Chipman, Polarimetry, Handbook of Opics II, 1995.

R. M. Azzam and N. M. Bashara, Ellipsometry and Polarized Light, 1987.

P. S. Hauge, Recent developments in instrumentation in ellipsometry, Surf. Sci, vol.96, pp.108-140, 1980.

H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications, 2007.

H. G. Tomkins, J. N. Hilfiker, and S. Ellipsometry, Practical Application to Thin Film Characterization (Momentum, 2016.

G. E. Jellison, J. , and F. A. Modine, Polarization modulation ellipsometry" in Handbook of Ellipsometry, 2005.

G. E. Jellison, J. , and F. A. Modine, Two-modulator generalized ellipsometry: theory, Appl. Opt, vol.36, pp.8190-8198, 1997.

N. N. Tipol, S. Kawabata, and Y. Otani, A partial Mueller matrix polarimeter using two photoelastic modulator and polarizer pairs, Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 1040713.

O. Arteaga and R. Ossikovski, Complete Mueller matrix from a partial polarimetry experiment: the twelveelement case, J. Opt. Soc. Am. A

A. S. Alenin, I. J. Vaughn, and J. Scott-tyo, A nine-channeled partial Mueller matrix polarimeter, Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 104070.

J. J. Gil and E. Bernabeu, Obtainment of the polarizing and retardation parameters of a non-depolarizing optical system from the polar decomposition of its Mueller matrix, Optik, vol.76, pp.67-71, 1987.

R. Ossikovski, Interpretation of nondepolarizing Mueller matrices based on singular value decomposition, J. Opt. Soc. Am. A, vol.25, pp.473-482, 2008.

J. J. Gil, R. Ossikovski, and P. Light, The Mueller Matrix Approach, 2016.

R. M. Azzam, A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices, Opt. Commun, vol.25, pp.137-140, 1978.

L. Y. Chen and D. W. Lynch, Scanning ellipsometer by rotating polarizer and analyzer, Appl. Opt, vol.26, pp.5221-5228, 1987.

T. M. El-agez, A. A. El-tayyan, and S. A. Taya, Rotating polarizer-analyzer scanning ellipsometer, Thin Solid Films, vol.518, pp.5610-5614, 2010.

R. Ossikovski and J. J. Gil, Basic properties and classification of Mueller matrices derived from their statistical definition, J. Opt. Soc. Am. A, vol.34, pp.1727-1737, 2017.

S. R. Cloude, Conditions for the physical realizability of matrix operators in polarimetry, SPIE Proc. Polarization Considerations for Optical Systems II, vol.1166, pp.177-185, 1989.

H. C. Van-de-hulst, Light Scattering by Small Particles, 1981.

O. Arteaga, Useful Mueller matrix symmetries for ellipsometry, Thin Solid Films, vol.571, pp.584-588, 2014.

M. Schubert, B. Rheinländer, J. A. Woollam, B. Johs, and C. M. Herzinger, Extension of rotating analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2, J. Opt. Soc. Am. A, vol.13, pp.875-883, 1996.

S. N. Savenkov, Optimization and structuring of the instrument matrix for polarimetric measurements, Opt. Eng, vol.41, pp.965-972, 2002.

A. S. Alenin and J. Scott-tyo, Structured decomposition design of partial Mueller matrix polarimeters, J. Opt. Soc. Am. A, vol.32, pp.1302-1312, 2015.

B. G. Hoover and J. Scott-tyo, Polarization component analysis for invariant discrimination, Appl. Opt, vol.46, pp.8364-8373, 2007.

O. Arteaga, J. Freudenthal, B. Wang, and B. Kahr, Mueller matrix polarimetry with four photoelastic modulators: theory and calibration, Appl. Opt, vol.51, pp.6805-6817, 2012.

M. Foldyna, E. Garcia-caurel, R. Ossikovski, A. D. Martino, and J. J. Gil, Retrieval of a non-depolarizing component of experimentally determined depolarizing Mueller matrices, Opt. Express, vol.17, pp.12794-12806, 2009.

R. Ossikovski, Alternative depolarization criteria for Mueller matrices, J. Opt. Soc. Am. A, vol.27, pp.808-814, 2010.

H. D. Noble, S. C. Mcclain, and R. A. Chipman, Mueller matrix roots depolarization parameters, Appl. Opt, vol.51, pp.735-744, 2012.

H. D. Noble and R. A. Chipman, Mueller matrix roots algorithm and computational considerations, Opt. Express, vol.20, pp.17-31, 2012.

R. Ossikovski and O. Arteaga, Integral decomposition and polarization properties of depolarizing Mueller matrices, Opt. Lett, vol.40, pp.954-957, 2015.