, Fundamentals of Polarized Light. A Statistical Optics Approach, 1998.
Polarimetry, Handbook of Opics II, 1995. ,
, Ellipsometry and Polarized Light, 1987.
Recent developments in instrumentation in ellipsometry, Surf. Sci, vol.96, pp.108-140, 1980. ,
, Spectroscopic Ellipsometry: Principles and Applications, 2007.
Practical Application to Thin Film Characterization (Momentum, 2016. ,
Polarization modulation ellipsometry" in Handbook of Ellipsometry, 2005. ,
Two-modulator generalized ellipsometry: theory, Appl. Opt, vol.36, pp.8190-8198, 1997. ,
A partial Mueller matrix polarimeter using two photoelastic modulator and polarizer pairs, Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 1040713. ,
Complete Mueller matrix from a partial polarimetry experiment: the twelveelement case, J. Opt. Soc. Am. A ,
A nine-channeled partial Mueller matrix polarimeter, Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 104070. ,
Obtainment of the polarizing and retardation parameters of a non-depolarizing optical system from the polar decomposition of its Mueller matrix, Optik, vol.76, pp.67-71, 1987. ,
Interpretation of nondepolarizing Mueller matrices based on singular value decomposition, J. Opt. Soc. Am. A, vol.25, pp.473-482, 2008. ,
, The Mueller Matrix Approach, 2016.
A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices, Opt. Commun, vol.25, pp.137-140, 1978. ,
Scanning ellipsometer by rotating polarizer and analyzer, Appl. Opt, vol.26, pp.5221-5228, 1987. ,
Rotating polarizer-analyzer scanning ellipsometer, Thin Solid Films, vol.518, pp.5610-5614, 2010. ,
Basic properties and classification of Mueller matrices derived from their statistical definition, J. Opt. Soc. Am. A, vol.34, pp.1727-1737, 2017. ,
Conditions for the physical realizability of matrix operators in polarimetry, SPIE Proc. Polarization Considerations for Optical Systems II, vol.1166, pp.177-185, 1989. ,
, Light Scattering by Small Particles, 1981.
Useful Mueller matrix symmetries for ellipsometry, Thin Solid Films, vol.571, pp.584-588, 2014. ,
Extension of rotating analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2, J. Opt. Soc. Am. A, vol.13, pp.875-883, 1996. ,
Optimization and structuring of the instrument matrix for polarimetric measurements, Opt. Eng, vol.41, pp.965-972, 2002. ,
Structured decomposition design of partial Mueller matrix polarimeters, J. Opt. Soc. Am. A, vol.32, pp.1302-1312, 2015. ,
Polarization component analysis for invariant discrimination, Appl. Opt, vol.46, pp.8364-8373, 2007. ,
Mueller matrix polarimetry with four photoelastic modulators: theory and calibration, Appl. Opt, vol.51, pp.6805-6817, 2012. ,
Retrieval of a non-depolarizing component of experimentally determined depolarizing Mueller matrices, Opt. Express, vol.17, pp.12794-12806, 2009. ,
Alternative depolarization criteria for Mueller matrices, J. Opt. Soc. Am. A, vol.27, pp.808-814, 2010. ,
Mueller matrix roots depolarization parameters, Appl. Opt, vol.51, pp.735-744, 2012. ,
Mueller matrix roots algorithm and computational considerations, Opt. Express, vol.20, pp.17-31, 2012. ,
Integral decomposition and polarization properties of depolarizing Mueller matrices, Opt. Lett, vol.40, pp.954-957, 2015. ,