Lifetime assessment in crystalline silicon: From nanopatterned wafer to ultra-thin crystalline films for solar cells

I. Cosme 1 R. Cariou 1 W. Chen 1 M. Foldyna 1 R. Boukhicha 1 P. Roca I Cabarrocas 1 K.D. Lee C. Trompoukis 2, 3 V. Depauw 2
1 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
2 IMEC - IMEC
3 Departement Elektrotechniek - ESAT [leuven]
Document type :
Journal articles
Complete list of metadatas
https://hal-polytechnique.archives-ouvertes.fr/hal-01230115
Contributor : Martin Foldyna <>
Submitted on : Tuesday, November 17, 2015 - 6:05:42 PM
Last modification on : Wednesday, December 11, 2019 - 11:18:03 AM

Identifiers

Collections

X | CNRS | X-PICM | LPICM | PARISTECH | UNIV-PARIS-SACLAY | X-DEP-PHYS

Citation

I. Cosme, R. Cariou, W. Chen, M. Foldyna, R. Boukhicha, et al.. Lifetime assessment in crystalline silicon: From nanopatterned wafer to ultra-thin crystalline films for solar cells. Solar Energy Materials and Solar Cells, Elsevier, 2015, 135 (3), ⟨10.1016/j.solmat.2014.10.019⟩. ⟨hal-01230115⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

211

Contact

Informations

CCSD