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Lifetime assessment in crystalline silicon: From nanopatterned wafer to ultra-thin crystalline films for solar cells

I. Cosme 1 R. Cariou 1 W. Chen 1 M. Foldyna 1 R. Boukhicha 1 P. Roca I Cabarrocas 1 K.D. Lee C. Trompoukis 2, 3 V. Depauw 2 
1 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
2 IMEC - IMEC
3 Departement Elektrotechniek - ESAT [leuven]
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https://hal-polytechnique.archives-ouvertes.fr/hal-01230115
Contributor : Martin Foldyna Connect in order to contact the contributor
Submitted on : Tuesday, November 17, 2015 - 6:05:42 PM
Last modification on : Thursday, March 5, 2020 - 6:31:21 PM

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X | CNRS | X-PICM | X-DEP-PHYS | LPICM | UNIV-PARIS-SACLAY

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I. Cosme, R. Cariou, W. Chen, M. Foldyna, R. Boukhicha, et al.. Lifetime assessment in crystalline silicon: From nanopatterned wafer to ultra-thin crystalline films for solar cells. Solar Energy Materials and Solar Cells, Elsevier, 2015, 135 (3), ⟨10.1016/j.solmat.2014.10.019⟩. ⟨hal-01230115⟩

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