Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

Paul Narchi; Vladimir Neplokh; Valerio Piazza; Twan Bearda; Fabien Bayle; Martin Foldyna; Chiara Toccafondi; Patricia Prod’homme; Maria Tchernycheva; Pere Roca I Cabarrocas

doi:10.1016/j.solmat.2016.12.009

Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

Paul Narchi ¹ Vladimir Neplokh ² Valerio Piazza ² Twan Bearda ³ Fabien Bayle ⁴ Martin Foldyna ¹ Chiara Toccafondi ¹ Patricia Prod’homme ⁵ Maria Tchernycheva ⁶ Pere Roca I Cabarrocas ¹

1 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]

2 IEF - Institut d'électronique fondamentale

3 IMEC - IMEC

4 LHC - Laboratoire Hubert Curien [Saint Etienne]

5 Total New Energies

6 C2N - Centre de Nanosciences et de Nanotechnologies [Orsay]

Type de document :

Article dans une revue

Solar Energy Materials and Solar Cells, Elsevier, 2017, 161, pp.263 - 269. 〈10.1016/j.solmat.2016.12.009〉

Domaine :

Physique [physics] / Matière Condensée [cond-mat] / Science des matériaux [cond-mat.mtrl-sci]

Liste complète des métadonnées

https://hal-polytechnique.archives-ouvertes.fr/hal-01640075
Contributeur : Martin Foldyna <>
Soumis le : lundi 20 novembre 2017 - 16:39:09
Dernière modification le : mercredi 25 juillet 2018 - 14:05:32

Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

Identifiants

Collections

Citation

Exporter

Métriques

110

Contact

Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

Identifiants

Collections

Citation

Exporter

Partager

Métriques

110

Contact