Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

Paul Narchi; Vladimir Neplokh; Valerio Piazza; Twan Bearda; Fabien Bayle; Martin Foldyna; Chiara Toccafondi; Patricia Prod’homme; Maria Tchernycheva; Pere Roca I Cabarrocas

doi:10.1016/j.solmat.2016.12.009

Journal articles

Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

Paul Narchi ¹ Vladimir Neplokh ² Valerio Piazza ² Twan Bearda ³ Fabien Bayle ⁴ Martin Foldyna ¹ Chiara Toccafondi ¹ Patricia Prod’homme ⁵ Maria Tchernycheva ⁶ Pere Roca I Cabarrocas ¹

1 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]

2 IEF - Institut d'électronique fondamentale

3 IMEC - IMEC

4 LHC - Laboratoire Hubert Curien [Saint Etienne]

5 Total New Energies

6 C2N - Centre de Nanosciences et de Nanotechnologies [Orsay]

Document type :

Journal articles

Domain :

Physics [physics] / Condensed Matter [cond-mat] / Materials Science [cond-mat.mtrl-sci]

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https://hal-polytechnique.archives-ouvertes.fr/hal-01640075
Contributor : Martin Foldyna Connect in order to contact the contributor
Submitted on : Monday, November 20, 2017 - 4:39:09 PM
Last modification on : Saturday, June 25, 2022 - 10:27:32 PM

Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

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Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

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